Temperature phase transition and an effective expansion parameter in theO(N)model
نویسندگان
چکیده
منابع مشابه
2 00 1 Temperature phase transition and an effective expansion parameter in the O ( N ) - model
The temperature phase transition in the N-component scalar field theory with spontaneous symmetry breaking is investigated in the pertur-bative approach. The second Legendre transform is used together with the consideration of the gap equations in the extrema of the free energy. Resummations are performed on the super daisy level and beyond. The phase transition turns out to be weakly of first ...
متن کاملJ ul 2 00 1 Temperature phase transition and an effective expansion parameter in the O ( N ) - model
The temperature phase transition in the N-component scalar field theory with the spontaneous symmetry breaking is investigated in the pertur-bative approach.The second Legendre transform and consideration of the gap equations in the extrema of the free energy functional is used. The super daisy and beyond resummations are applied. In the super daisy approximation a first order phase transition ...
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We investigate the low energy properties of Lorentz-invariant theories with a spontaneously broken rotation symmetry O(N) → O(N–1). The leading coefficients of the low temperature expansion for the partition function are calculated up to and including three loops. Emphasis is put into the special case N=3: it describes the antiferromagnet which has been extensively studied. Our results obtained...
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This paper addresses the annealing temperature effect on nanostructure and phase transition of copper oxide thin films, deposited by PVD method on glass substrate (at 110 nm thickness) and post annealed at different temperatures (200-400°C) with a flow of 1 cm3s-1 Oxygen. The X-ray diffraction (XRD) was employed for crystallographic and phase analyses, while atomic force m...
متن کاملAnnealing temperature effect on nanostructure and phase transition of Copper Oxide thin films
This paper addresses the annealing temperature effect on nanostructure and phase transition of copper oxide thin films, deposited by PVD method on glass substrate (at 110 nm thickness) and post annealed at different temperatures (200-400°C) with a flow of 1 cm3s-1 Oxygen. The X-ray diffraction (XRD) was employed for crystallographic and phase analyses, while atomic force m...
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ژورنال
عنوان ژورنال: Physical Review D
سال: 2002
ISSN: 0556-2821,1089-4918
DOI: 10.1103/physrevd.65.085025